Conference item
Super-resolution from multiple views using learnt image models
- Abstract:
- The objective of the work presented is the super-resolution restoration of a set of images, and we investigate the use of learnt image models within a generative Bayesian framework. It is demonstrated that restoration of far higher quality than that determined by classical maximum likelihood estimation can be achieved by either constraining the solution to lie on a restricted sub-space, or by using the sub-space to define a spatially varying prior. This sub-space can be learnt from image examples. The methods are applied to both real and synthetic images of text and faces, and results are compared to R.R. Schultz and R.L. Stevenson's (1996) MAP estimator. We consider in particular images of scenes for which the point-to-point mapping is a plane projective transformation which has 8 degrees of freedom. In the real image examples, registration is obtained from the images using automatic methods.
- Publication status:
- Published
- Peer review status:
- Peer reviewed
Actions
Access Document
- Files:
-
-
(Preview, Accepted manuscript, pdf, 892.1KB, Terms of use)
-
- Publisher copy:
- 10.1109/cvpr.2001.991022
Authors
- Publisher:
- IEEE
- Host title:
- Proceedings of the 2001 IEEE Computer Society Conference on Computer Vision and Pattern Recognition. CVPR 2001
- Volume:
- 2
- Pages:
- ii627-ii634
- Publication date:
- 2003-04-15
- Event title:
- 2001 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR 2001)
- Event location:
- Kauai, Hawaii, USA
- Event start date:
- 2001-12-08
- Event end date:
- 2001-12-14
- DOI:
- ISSN:
-
1063-6919
- ISBN:
- 0769512720
- Language:
-
English
- Keywords:
- Pubs id:
-
61942
- Local pid:
-
pubs:61942
- Deposit date:
-
2024-07-26
Terms of use
- Copyright holder:
- IEEE
- Copyright date:
- 2001
- Rights statement:
- © Copyright 2001 IEEE - All rights reserved
- Notes:
- This is the accepted manuscript version of the article. The final version is available online from IEEE at https://dx.doi.org/10.1109/cvpr.2001.991022
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