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Journal article

Strain tensor mapping at the nanoscale using electron back scatter diffraction

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Publisher copy:
10.1017/S1431927606065883

Authors


Wilkinson, AJ More by this author
Dingley, DJ More by this author
Journal:
Microscopy and Microanalysis
Volume:
12
Issue:
SUPPL. 2
Pages:
66-67
Publication date:
2006-08-05
DOI:
EISSN:
1435-8115
ISSN:
1431-9276
URN:
uuid:71aa724b-3ca7-4e0e-966b-fae8e7c6d281
Source identifiers:
285853
Local pid:
pubs:285853
Language:
English

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