Journal article

Strain tensor mapping at the nanoscale using electron back scatter diffraction

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APA Style

Wilkinson, A., Meaden, G., & Dingley, D. (2006). Strain tensor mapping at the nanoscale using electron back scatter diffraction. Microscopy and Microanalysis, 12(SUPPL. 2), 66–67.

MLA Style

Wilkinson, A., et al. “Strain Tensor Mapping at the Nanoscale Using Electron Back Scatter Diffraction.” Microscopy and Microanalysis, vol. 12, no. SUPPL. 2, 2006, pp. 66–67.

Chicago Style

Wilkinson, A, G Meaden, and D Dingley. 2006. “Strain Tensor Mapping at the Nanoscale Using Electron Back Scatter Diffraction.” Microscopy and Microanalysis 12 (SUPPL. 2): 66–67.
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Publisher copy:: 10.1017/S1431927606065883

Authors

+ Wilkinson, A More by this author

Role:: Author

+ Meaden, G More by this author

Role:: Author

+ Dingley, D More by this author

Role:: Author

Journal:: Microscopy and Microanalysis More from this journal
Volume:: 12
Issue:: SUPPL. 2
Pages:: 66-67
Publication date:: 2006-08-01
DOI:: 10.1017/S1431927606065883
EISSN:: 1435-8115
ISSN:: 1431-9276

Language:: English
Pubs id:: pubs:285853
UUID:: uuid:71aa724b-3ca7-4e0e-966b-fae8e7c6d281
Local pid:: pubs:285853
Source identifiers:: 285853
Deposit date:: 2013-11-17

Terms of use

Copyright date:: 2006

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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