Conference item
Modelling charge storage near full well in CCDs
- Abstract:
- The shape and size of the stored charge packet within a CCD pixel after exposure has implications for optimal device operation, susceptibility to radiation damage and modelling of dynamic charge collection effects such as the “Brighter-Fatter Effect”. Above the full well capacity, phenomena such as bleed trails and surface charge loss occur. In this paper we discuss why accurately reproducing saturation effects in simulations based on electrostatics is difficult, and present an approach to modelling the storage of charge in CCD pixels using commercial semiconductor simulation software. We suggest experimental measurements which can be connected to such modelling. Full well measurements on a thick, high resistivity back illuminated sensor (the e2v CCD261) are presented.
- Publication status:
- Published
- Peer review status:
- Peer reviewed
Actions
Access Document
- Files:
-
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(Preview, Accepted manuscript, pdf, 762.7KB, Terms of use)
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- Publisher copy:
- 10.1088/1748-0221/12/05/C05008
Authors
- Publisher:
- Institute of Physics
- Host title:
- Precision Astronomy with Fully Depleted CCDs
- Journal:
- Precision Astronomy with Fully Depleted CCDs More from this journal
- Volume:
- 12
- Pages:
- C05008
- Publication date:
- 2017-05-01
- Acceptance date:
- 2017-05-02
- DOI:
- Keywords:
- Pubs id:
-
pubs:695457
- UUID:
-
uuid:6ea9ed7f-237a-448c-b4ed-bb4cacd0594f
- Local pid:
-
pubs:695457
- Source identifiers:
-
695457
- Deposit date:
-
2017-05-16
Terms of use
- Copyright holder:
- IOP Publishing Ltd and Sissa Medialab srl
- Copyright date:
- 2017
- Notes:
- © 2017 IOP Publishing Ltd and Sissa Medialab srl
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