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Modelling charge storage near full well in CCDs

Abstract:
The shape and size of the stored charge packet within a CCD pixel after exposure has implications for optimal device operation, susceptibility to radiation damage and modelling of dynamic charge collection effects such as the “Brighter-Fatter Effect”. Above the full well capacity, phenomena such as bleed trails and surface charge loss occur. In this paper we discuss why accurately reproducing saturation effects in simulations based on electrostatics is difficult, and present an approach to modelling the storage of charge in CCD pixels using commercial semiconductor simulation software. We suggest experimental measurements which can be connected to such modelling. Full well measurements on a thick, high resistivity back illuminated sensor (the e2v CCD261) are presented.
Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1088/1748-0221/12/05/C05008

Authors


More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Sub department:
Particle Physics
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Sub department:
Particle Physics
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Sub department:
Particle Physics
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Sub department:
Particle Physics
Role:
Author


Publisher:
Institute of Physics
Host title:
Precision Astronomy with Fully Depleted CCDs
Journal:
Precision Astronomy with Fully Depleted CCDs More from this journal
Volume:
12
Pages:
C05008
Publication date:
2017-05-01
Acceptance date:
2017-05-02
DOI:


Keywords:
Pubs id:
pubs:695457
UUID:
uuid:6ea9ed7f-237a-448c-b4ed-bb4cacd0594f
Local pid:
pubs:695457
Source identifiers:
695457
Deposit date:
2017-05-16

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