Journal article
SIMS investigation of electron-beam damage to hydrous, rhyolitic glasses: Implications for melt inclusion analysis
- Abstract:
-
Electron-beam irradiation causes permanent damage to hydrous, silica-rich glasses. The extent of electron-beam damage is quantified using data generated by SIMS analysis of points subjected to previous electron microprobe analysis (EPMA). Even optimum EPMA conditions cause damage to the glass, manifest as a marked depletion in alkali ions at the surface of an irradiated sample. Deeper in the sample, an enrichment in alkali ions to above-baseline levels is followed by a decay back to baseline....
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- Publication status:
- Published
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- Publisher copy:
- 10.2138/am.2006.1936
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Authors
Bibliographic Details
- Journal:
- AMERICAN MINERALOGIST
- Volume:
- 91
- Issue:
- 4
- Pages:
- 667-679
- Publication date:
- 2006-04-01
- DOI:
- ISSN:
-
0003-004X
- Source identifiers:
-
184852
Item Description
- Language:
- English
- Keywords:
- Pubs id:
-
pubs:184852
- UUID:
-
uuid:6e6d5565-caf1-461b-bd9b-1b773f8783f8
- Local pid:
- pubs:184852
- Deposit date:
- 2012-12-19
Terms of use
- Copyright date:
- 2006
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