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SIMS investigation of electron-beam damage to hydrous, rhyolitic glasses: Implications for melt inclusion analysis

Abstract:

Electron-beam irradiation causes permanent damage to hydrous, silica-rich glasses. The extent of electron-beam damage is quantified using data generated by SIMS analysis of points subjected to previous electron microprobe analysis (EPMA). Even optimum EPMA conditions cause damage to the glass, manifest as a marked depletion in alkali ions at the surface of an irradiated sample. Deeper in the sample, an enrichment in alkali ions to above-baseline levels is followed by a decay back to baseline....

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Publication status:
Published

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Publisher copy:
10.2138/am.2006.1936

Authors


Humphreys, MCS More by this author
Kearns, SL More by this author
Blundy, JD More by this author
Journal:
AMERICAN MINERALOGIST
Volume:
91
Issue:
4
Pages:
667-679
Publication date:
2006-04-05
DOI:
ISSN:
0003-004X
URN:
uuid:6e6d5565-caf1-461b-bd9b-1b773f8783f8
Source identifiers:
184852
Local pid:
pubs:184852

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