Journal article
In-situ observation of stacking fault evolution in vacuum-deposited C60
- Abstract:
-
We report an in-situ study of stacking fault evolution in C 60 thin films using grazing-incidence x-ray scattering (GIXS). A Williamson-Hall analysis of the main scattering features during growth of a 15 nm film on glass indicate lattice strain as high as 6% in the first 5 nm of the film, with a decrease to 2% beyond 8 nm thickness. Deformation stacking faults along the {220} plane are found to occur with 68% probability, and closely linked to the formation of a nanocrystalline powder-like fi...
Expand abstract
- Publication status:
- Published
- Peer review status:
- Peer reviewed
Actions
Authors
Funding
+ Wolfson College, Oxford
More from this funder
Funding agency for:
Martinez Hardigree, J
Grant:
Junior
Research Fellowship
+ Science and Technology Facilities Council
More from this funder
Grant:
ChallengeLed
Applied Systems Programme (CLASP, ST/L003309/1
Bibliographic Details
- Publisher:
- AIP Publishing Publisher's website
- Journal:
- Applied Physics Letters Journal website
- Volume:
- 111
- Issue:
- 23
- Article number:
- 233305
- Publication date:
- 2017-12-08
- Acceptance date:
- 2017-11-13
- DOI:
- EISSN:
-
1077-3118
- ISSN:
-
0003-6951
Item Description
- Keywords:
- Pubs id:
-
pubs:745686
- UUID:
-
uuid:6e5d65db-3f5c-4dd2-998d-30985a3e7d72
- Local pid:
- pubs:745686
- Source identifiers:
-
745686
- Deposit date:
- 2017-11-14
Terms of use
- Copyright holder:
- Hardigree et al
- Copyright date:
- 2017
- Notes:
-
Copyright © 2017 Authors. All article content, except where otherwise noted, is
licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). https://doi.org/10.1063/1.4995571
- Licence:
- CC Attribution (CC BY)
Metrics
If you are the owner of this record, you can report an update to it here: Report update to this record