Journal article
The Design of a Low-Cost adiometric dystem for photovoltaic solar cells
- Abstract:
- Photo-voltaic (PV) cell manufacturers use a standard spectrum when designing and characterizing their systems. However, various authors have shown that variations in the spectrum of light during different seasons and/or in different locations have a significant impact of the efficiency of PV cells. Consequently, metrics such as the Average Photon Energy (APE), the Useful Fraction (UF) and the weighted Useful Fraction (WUF), have been proposed and successfully used to demonstrate the relationship between the spectrum of the incident radiation and PV cells efficiency. In this work we propose the use of an inexpensive radiometric system to accurately determine the spectrum of incident light and hence some of these efficiency metrics in real time. This system could easily be integrated within a PV cell system so that these parameters are available for both system assessment and possibly for maximum power point tracking (MPPT) systems that can deal with challenging partial shading conditions.
- Publication status:
- Published
- Peer review status:
- Peer reviewed
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- Files:
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(Preview, Accepted manuscript, pdf, 416.6KB, Terms of use)
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- Publisher copy:
- 10.1109/JPHOTOV.2016.2611241
Authors
- Publisher:
- Institute of Electrical and Electronics Engineers
- Journal:
- IEEE Journal of Photovoltaics More from this journal
- Volume:
- 6
- Issue:
- 6
- Pages:
- 1605-1610
- Publication date:
- 2016-10-03
- Acceptance date:
- 2016-09-14
- DOI:
- ISSN:
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2156-3381
- Keywords:
- Pubs id:
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pubs:644277
- UUID:
-
uuid:6d7961d8-2d3b-4216-883d-02fd063af0c7
- Local pid:
-
pubs:644277
- Source identifiers:
-
644277
- Deposit date:
-
2016-09-19
- ARK identifier:
Terms of use
- Copyright holder:
- IEEE
- Copyright date:
- 2016
- Notes:
-
© 2016 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission.
See http://www.ieee.org/publications standards/publications/rights/index.html for more information. This is the author accepted manuscript following peer review version of the article. The final version is available online from Institute of Electrical and Electronics Engineers.
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