Journal article

Transverse field muon-spin rotation measurement of the topological anomaly in a thin film of MnSi

Abstract:: We present the results of transverse-field muon-spin rotation measurements on an epitaxially grown 40 nm-thick film of MnSi on Si(111) in the region of the field-temperature phase diagram where a skyrmion phase has been observed in the bulk. We identify changes in the quasistatic magnetic field distribution sampled by the muon, along with evidence for magnetic transitions around T ≈ 40 K and 30 K. Our results suggest that the cone phase is not the only magnetic texture realized in film samples for out-of-plane fields.

Publication status:: Submitted

Peer review status:: Under review

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APA Style

Lancaster, T., Xiao, F., Salman, Z., Thomas, I., Blundell, S., Pratt, F., Clark, S., Prokscha, T., Suter, A., Zhang, S., Baker, A., & Hesjedal, T. (2015). Transverse field muon-spin rotation measurement of the topological anomaly in a thin film of MnSi. ArXiv:1511.04972v1.

MLA Style

Lancaster, T., et al. “Transverse Field Muon-Spin Rotation Measurement of the Topological Anomaly in a Thin Film of MnSi.” ArXiv:1511.04972v1, 2015.

Chicago Style

Lancaster, T, F Xiao, Z Salman, I Thomas, S Blundell, F Pratt, S Clark, et al. 2015. “Transverse Field Muon-Spin Rotation Measurement of the Topological Anomaly in a Thin Film of MnSi.” ArXiv:1511.04972v1.
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+ Lancaster, T More by this author

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+ Xiao, F More by this author

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+ Salman, Z More by this author

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+ Thomas, I More by this author

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+ Blundell, S More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Physics
Sub department:: Condensed Matter Physics
Role:: Author

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Journal:: arXiv:1511.04972v1 More from this journal

Pubs id:: pubs:574456
UUID:: uuid:6bed8204-ad2f-4928-9f70-0a742a46fbe5
Local pid:: pubs:574456
Source identifiers:: 574456
Deposit date:: 2015-11-18

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