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Generalised residual stress depth profiling at the nanoscale using focused ion beam milling

Abstract:

The study of Residual Stress is gaining more and more attention due to its importance in design for structural integrity. At present a lot of emphasis is placed on understanding the origins of mechanical failure that lie at the nano-/micron-scale. This leads to the evident need for evaluating residual stress distributions at increasingly smaller scales, and the search for modern tools capable of accomplishing this task. Prior state-of-the-art methodologies mostly required expensive and time-c...

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Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1016/j.jmps.2019.01.007

Authors


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Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
More by this author
Institution:
University of Oxford
Department:
Engineering Science
Role:
Author
More by this author
Institution:
University of Oxford
Department:
Engineering Science
Oxford college:
Trinity College
Role:
Author
ORCID:
0000-0002-3558-5198
Publisher:
Elsevier
Journal:
Journal of the Mechanics and Physics of Solids More from this journal
Volume:
125
Pages:
488-501
Publication date:
2019-01-11
Acceptance date:
2019-01-10
DOI:
ISSN:
0022-5096
Language:
English
Pubs id:
pubs:971358
UUID:
uuid:6b16ac9c-3f13-454d-9180-aebfe7363c71
Local pid:
pubs:971358
Source identifiers:
971358
Deposit date:
2019-04-05

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