Journal article
Generalised residual stress depth profiling at the nanoscale using focused ion beam milling
- Abstract:
-
The study of Residual Stress is gaining more and more attention due to its importance in design for structural integrity. At present a lot of emphasis is placed on understanding the origins of mechanical failure that lie at the nano-/micron-scale. This leads to the evident need for evaluating residual stress distributions at increasingly smaller scales, and the search for modern tools capable of accomplishing this task. Prior state-of-the-art methodologies mostly required expensive and time-c...
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- Publication status:
- Published
- Peer review status:
- Peer reviewed
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Authors
Bibliographic Details
- Publisher:
- Elsevier Publisher's website
- Journal:
- Journal of the Mechanics and Physics of Solids Journal website
- Volume:
- 125
- Pages:
- 488-501
- Publication date:
- 2019-01-11
- Acceptance date:
- 2019-01-10
- DOI:
- ISSN:
-
0022-5096
Item Description
- Language:
- English
- Pubs id:
-
pubs:971358
- UUID:
-
uuid:6b16ac9c-3f13-454d-9180-aebfe7363c71
- Local pid:
- pubs:971358
- Source identifiers:
-
971358
- Deposit date:
- 2019-04-05
Terms of use
- Copyright holder:
- Elsevier
- Copyright date:
- 2019
- Rights statement:
- © 2019 Elsevier Ltd. All rights reserved.
- Notes:
- This is the accepted manuscript version of the article. The final version is available from Elsevier at: https://doi.org/10.1016/j.jmps.2019.01.007
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