Strain mapping using electron backscatter diffraction

Journal article

In this chapter we review the progress that has been made toward elastic strain (i.e., stress) mapping using electron backscatter diffraction. In particular we focus on development of an analysis method based on using cross-correlation to determine small shifts in the EBSD patterns with respect to a reference pattern. The pattern shifts are determined at many subregions dispersed across the wide angular span of the EBSD pattern, and the magnitude and angular distribution of shifts allows the ...

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Authors: Wilkinson, A; Dingley, D; Meaden, G

• Publisher: Springer US
• Pages: 231-249
• Publication date: 2009-01-01
• DOI: 10.1007/978-0-387-88136-2_17
• Language: English