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Managing dose-, damage- and data-rates in multi-frame spectrum-imaging

Abstract:

As an instrument, the scanning transmission electron microscope is unique in being able to simultaneously explore both local structural and chemical variations in materials at the atomic scale. This is made possible as both types of data are acquired serially, originating simultaneously from sample interactions with a sharply focused electron probe. Unfortunately, such scanned data can be distorted by environmental factors, though recently fast-scanned multi-frame imaging approaches have been...

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Publication status:
Published
Peer review status:
Peer reviewed
Version:
Accepted Manuscript

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Publisher copy:
10.1093/jmicro/dfx125

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Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Role:
Author
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Johnson Matthey More from this funder
Publisher:
Oxford University Press Publisher's website
Journal:
Microscopy Journal website
Volume:
67
Issue:
S1
Pages:
i98–i113
Publication date:
2018-01-11
Acceptance date:
2017-12-04
DOI:
EISSN:
2050-5701
ISSN:
2050-5698
Pubs id:
pubs:817394
URN:
uri:68f5b25b-ea1c-4e0e-85e4-b9d721d5b97d
UUID:
uuid:68f5b25b-ea1c-4e0e-85e4-b9d721d5b97d
Local pid:
pubs:817394

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