Journal article
Variational-state quantum metrology
- Abstract:
-
Quantum technologies exploit entanglement to enhance various tasks beyond their classical limits including computation, communication and measurements. Quantum metrology aims to increase the precision of a measured quantity that is estimated in the presence of statistical errors using entangled quantum states. We present a novel approach for finding (near) optimal states for metrology in the presence of noise, using variational techniques as a tool for efficiently searching the high-dimension...
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- Publication status:
- Published
- Peer review status:
- Peer reviewed
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Authors
Bibliographic Details
- Publisher:
- IOP Publishing Publisher's website
- Journal:
- New Journal of Physics Journal website
- Volume:
- 22
- Issue:
- 8
- Article number:
- 83038
- Publication date:
- 2020-08-14
- Acceptance date:
- 2020-05-26
- DOI:
- EISSN:
-
1367-2630
Item Description
- Language:
- English
- Keywords:
- Pubs id:
-
1131499
- Local pid:
- pubs:1131499
- Deposit date:
- 2021-04-14
Terms of use
- Copyright holder:
- Koczor et al.
- Copyright date:
- 2020
- Rights statement:
- © 2020 The Author(s). Published by IOP Publishing Ltd on behalf of the Institute of Physics and Deutsche Physikalische Gesellschaft. Original content from this work may be used under the terms of the Creative Commons Attribution 4.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
- Licence:
- CC Attribution (CC BY)
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