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Variational-state quantum metrology

Abstract:

Quantum technologies exploit entanglement to enhance various tasks beyond their classical limits including computation, communication and measurements. Quantum metrology aims to increase the precision of a measured quantity that is estimated in the presence of statistical errors using entangled quantum states. We present a novel approach for finding (near) optimal states for metrology in the presence of noise, using variational techniques as a tool for efficiently searching the high-dimension...

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Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1088/1367-2630/ab965e

Authors


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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Oxford college:
Exeter College
Role:
Author
ORCID:
0000-0002-7766-5348
Publisher:
IOP Publishing Publisher's website
Journal:
New Journal of Physics Journal website
Volume:
22
Issue:
8
Article number:
83038
Publication date:
2020-08-14
Acceptance date:
2020-05-26
DOI:
EISSN:
1367-2630
Language:
English
Keywords:
Pubs id:
1131499
Local pid:
pubs:1131499
Deposit date:
2021-04-14

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