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Lateral shearing interferometry of high-harmonic wavefronts.

Abstract:
We present a technique for frequency-resolved wavefront characterization of high harmonics based on lateral shearing interferometry. Tilted replicas of the driving laser pulse are produced by a Mach-Zehnder interferometer, producing separate focii in the target. The interference of the resulting harmonics on a flat-field extreme ultraviolet spectrometer yields the spatial phase derivative. A comprehensive set of spatial profiles, resolved by harmonic order, validate the technique and reveal the interplay of single-atom and macroscopic effects.
Publication status:
Published

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Publisher copy:
10.1364/OL.36.001746

Authors


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Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Role:
Author


Publisher:
OSA
Journal:
Opt Lett More from this journal
Volume:
36
Issue:
10
Pages:
1746-1748
Publication date:
2011-05-15
DOI:
EISSN:
1539-4794
ISSN:
0146-9592


Language:
English
Pubs id:
pubs:146749
UUID:
uuid:666217b9-4c89-4a25-89f2-68a12fb5993c
Local pid:
pubs:146749
Source identifiers:
146749
Deposit date:
2012-04-04

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