Journal article
Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEM
- Abstract:
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Spectroscopic signals such as EDS and EELS provide an effective way of characterising multi-element samples such as Pt-Co nanoparticles in STEM. The advantage of spectroscopy over imaging is the ability to decouple composition and mass-thickness effects for thin samples, into the number of various types of atoms in a sample. This is currently not possible for multi element samples using conventional ADF quantification techniques alone. With recent developments in microscope hardware and softw...
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- Publication status:
- Published
- Peer review status:
- Peer reviewed
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- Files:
-
-
(Accepted manuscript, pdf, 1.4MB)
-
- Publisher copy:
- 10.1016/j.micron.2018.06.015
Authors
Funding
Bibliographic Details
- Publisher:
- Elsevier Publisher's website
- Journal:
- Micron Journal website
- Volume:
- 113
- Pages:
- 69-82
- Publication date:
- 2018-06-28
- Acceptance date:
- 2018-06-22
- DOI:
- EISSN:
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1878-4291
- ISSN:
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0968-4328
- Pmid:
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30007859
Item Description
- Language:
- English
- Keywords:
- Pubs id:
-
pubs:889617
- UUID:
-
uuid:63eaad9d-ab1c-41f5-8731-427298840179
- Local pid:
- pubs:889617
- Source identifiers:
-
889617
- Deposit date:
- 2019-06-18
Terms of use
- Copyright holder:
- Elsevier
- Copyright date:
- 2018
- Notes:
- © 2018 Elsevier Ltd. All rights reserved. This is the accepted manuscript version of the article. The final version is available online from Elsevier at: https://doi.org/10.1016/j.micron.2018.06.015.
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