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Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEM

Abstract:

Spectroscopic signals such as EDS and EELS provide an effective way of characterising multi-element samples such as Pt-Co nanoparticles in STEM. The advantage of spectroscopy over imaging is the ability to decouple composition and mass-thickness effects for thin samples, into the number of various types of atoms in a sample. This is currently not possible for multi element samples using conventional ADF quantification techniques alone. With recent developments in microscope hardware and softw...

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Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1016/j.micron.2018.06.015

Authors


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Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Oxford college:
St Antony's College
Role:
Author
ORCID:
0000-0002-6907-0731
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Role:
Author
ORCID:
0000-0001-6959-9849
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Oxford college:
Corpus Christi College
Role:
Author
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Name:
Engineering & Physical Sciences Research Council
Grant:
1772738
Publisher:
Elsevier
Journal:
Micron More from this journal
Volume:
113
Pages:
69-82
Publication date:
2018-06-28
Acceptance date:
2018-06-22
DOI:
EISSN:
1878-4291
ISSN:
0968-4328
Pmid:
30007859
Language:
English
Keywords:
Pubs id:
pubs:889617
UUID:
uuid:63eaad9d-ab1c-41f5-8731-427298840179
Local pid:
pubs:889617
Source identifiers:
889617
Deposit date:
2019-06-18

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