Journal article
Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam.
- Abstract:
-
To perform reduced density function (G(r)) analysis on electron diffraction patterns of amorphous materials formed with convergent beams, the effects of convergence must be removed from the diffraction data. Assuming electrons incident upon the sample in different directions are incoherent, this can be done using deconvolution (Ultramicroscopy 76 (1999) 115). In this letter we show that the combination of an energy filtering transmission electron microscope with an image plate, increases the ...
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- Publication status:
- Published
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- Publisher copy:
- 10.1016/s0304-3991(02)00340-6
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Bibliographic Details
- Journal:
- Ultramicroscopy
- Volume:
- 94
- Issue:
- 3-4
- Pages:
- 305-308
- Publication date:
- 2003-04-05
- DOI:
- EISSN:
-
1879-2723
- ISSN:
-
0304-3991
- URN:
-
uuid:61e50efe-4985-432b-a291-acc0ca8a1081
- Source identifiers:
-
19261
- Local pid:
- pubs:19261
Item Description
- Language:
- English
- Keywords:
Terms of use
- Copyright date:
- 2003
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