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Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam.

Abstract:

To perform reduced density function (G(r)) analysis on electron diffraction patterns of amorphous materials formed with convergent beams, the effects of convergence must be removed from the diffraction data. Assuming electrons incident upon the sample in different directions are incoherent, this can be done using deconvolution (Ultramicroscopy 76 (1999) 115). In this letter we show that the combination of an energy filtering transmission electron microscope with an image plate, increases the ...

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Publication status:
Published

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Authors


McBride, W More by this author
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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Journal:
Ultramicroscopy
Volume:
94
Issue:
3-4
Pages:
305-308
Publication date:
2003-04-05
DOI:
EISSN:
1879-2723
ISSN:
0304-3991
URN:
uuid:61e50efe-4985-432b-a291-acc0ca8a1081
Source identifiers:
19261
Local pid:
pubs:19261

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