Journal article

Analysis and assessment of the effects of fixed pattern and quantization noise on the accuracy of color rendition in wide-dynamic-range complementary metal-oxide semiconductor imagers

Publication status:: Published

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APA Style

Otim, S., & Collins, S. (2010). Analysis and assessment of the effects of fixed pattern and quantization noise on the accuracy of color rendition in wide-dynamic-range complementary metal-oxide semiconductor imagers. JOURNAL OF ELECTRONIC IMAGING, 19(1), 011011–011011.

MLA Style

Otim, S., and S. Collins. “Analysis and Assessment of the Effects of Fixed Pattern and Quantization Noise on the Accuracy of Color Rendition in Wide-Dynamic-Range Complementary Metal-Oxide Semiconductor Imagers.” JOURNAL OF ELECTRONIC IMAGING, vol. 19, no. 1, 2010, pp. 011011–11.

Chicago Style

Otim, S, and S Collins. 2010. “Analysis and Assessment of the Effects of Fixed Pattern and Quantization Noise on the Accuracy of Color Rendition in Wide-Dynamic-Range Complementary Metal-Oxide Semiconductor Imagers.” JOURNAL OF ELECTRONIC IMAGING 19 (1): 011011–11.
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Publisher copy:: 10.1117/1.3272597

Authors

+ Otim, S More by this author

Role:: Author

+ Collins, S More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Engineering Science
Role:: Author

Journal:: JOURNAL OF ELECTRONIC IMAGING More from this journal
Volume:: 19
Issue:: 1
Pages:: 011011-011011
Publication date:: 2010-01-01
DOI:: 10.1117/1.3272597
ISSN:: 1017-9909

Pubs id:: pubs:64803
UUID:: uuid:60e79d89-b6fe-403e-a234-3e77aa8146fd
Local pid:: pubs:64803
Source identifiers:: 64803
Deposit date:: 2012-12-19

Terms of use

Copyright date:: 2010

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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