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Applications of spatial distribution maps for advanced atom probe reconstruction and data analysis

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Publisher copy:
10.1017/S1431927609092599

Authors


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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author


Journal:
Microscopy and Microanalysis More from this journal
Volume:
15
Issue:
SUPPL. 2
Pages:
246-247
Publication date:
2009-07-01
DOI:
EISSN:
1435-8115
ISSN:
1431-9276


Language:
English
Pubs id:
pubs:360407
UUID:
uuid:5cf8682d-3f65-423a-8e27-6a1377d13cb2
Local pid:
pubs:360407
Source identifiers:
360407
Deposit date:
2013-11-16

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