Conference item

TEM characterization of stress corrosion cracks in 304SS

Abstract:: This paper reports the analysis of a sample of type 304 stainless steel tested under constant load (CLT) in a simulated pressurized water reactor environment in which had developed a mixture of both long (of the order of mm) and short (a few microns) cracks. A duplex oxide layer structure was observed along the flanks of all cracks. The chemical composition of the two layers remained constant and independent of crack depth. However, differences were observed as a function of crack depth between the thicknesses and sizes of the spinel crystallites that composed the two layers. The implication of these observations for SCC mechanisms is described.

Publication status:: Published

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APA Style

Lozano-Perez, S., Titchmarsh, J., & Jenkins, M. (2004). TEM characterization of stress corrosion cracks in 304SS. 179(179), 233–236.

MLA Style

Lozano-Perez, S., et al. TEM Characterization of Stress Corrosion Cracks in 304SS. no. 179, 2004, pp. 233–36.

Chicago Style

Lozano-Perez, S, J Titchmarsh, and M Jenkins. 2004. “TEM Characterization of Stress Corrosion Cracks in 304SS.” In , 179:233–36.
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Authors

+ Lozano-Perez, S More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Materials
Role:: Author

+ Titchmarsh, J More by this author

Role:: Author

+ Jenkins, M More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Materials
Role:: Author

Journal:: ELECTRON MICROSCOPY AND ANALYSIS 2003 More from this journal
Volume:: 179
Issue:: 179
Pages:: 233-236
Publication date:: 2004-01-01
Event title:: Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003)
ISSN:: 0951-3248
ISBN:: 0750309679

Keywords:: WATER
Pubs id:: pubs:10399
UUID:: uuid:5a65d9c0-832a-4f6e-80f8-fe983d77a874
Local pid:: pubs:10399
Source identifiers:: 10399
Deposit date:: 2012-12-19

Terms of use

Copyright date:: 2004

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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