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Secondary fluorescence in WDS: the role of spectrometer positioning

Abstract:

Secondary fluorescence, typically a minor error in routine electron probe microanalysis (EPMA), may not be negligible when performing high precision trace element analyses in multiphase samples. Other factors, notably wavelength dispersive spectrometer defocusing, may introduce analytical artefacts.


To explore these issues, we measured EPMA transects across two material couples chosen for their high fluorescence yield. We measured transects away from the fluorescent phase, and...

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Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1017/S1431927618015416

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Institution:
University of Oxford
Division:
MPLS Division
Department:
Earth Sciences
Role:
Author
ORCID:
0000-0002-6998-236X
Publisher:
Cambridge University Press Publisher's website
Journal:
Microscopy and Microanalysis Journal website
Volume:
24
Issue:
6
Pages:
604-611
Publication date:
2018-12-03
Acceptance date:
2018-10-16
DOI:
EISSN:
1435-8115
ISSN:
1431-9276
Pubs id:
pubs:927623
URN:
uri:53ee60d5-15d2-4824-ae09-65383db9cc3f
UUID:
uuid:53ee60d5-15d2-4824-ae09-65383db9cc3f
Local pid:
pubs:927623

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