Journal article

AFM studies of polypyrrole film surface morphology - I. The influence of film thickness and dopant nature

Abstract:: In this paper the surface morphology of electrogenerated polypyrrole films of various thicknesses and dopant anions (chloride, sulfate, perchlorate and dodecylsulfate) as studied by atomic force microscopy under ex situ conditions is reported. The roughness characteristics of the film surface are determined and discussed. © 1998 Elsevier Science S.A.

Publication status:: Published

Actions

Email

Email this record

Send the bibliographic details of this record to your email address.

Your Email
Please enter the email address that the record information will be sent to.

-
Your message (optional)
Please add any additional information to be included within the email.
Cite

Cite this record

APA Style

Silk, T., Hong, Q., Tamm, J., & Compton, R. (1998). AFM studies of polypyrrole film surface morphology - I. The influence of film thickness and dopant nature. SYNTHETIC METALS, 93(1), 59–64.

MLA Style

Silk, T., et al. “AFM Studies of Polypyrrole Film Surface Morphology - I. The Influence of Film Thickness and Dopant Nature.” SYNTHETIC METALS, vol. 93, no. 1, 1998, pp. 59–64.

Chicago Style

Silk, T, Q Hong, J Tamm, and R Compton. 1998. “AFM Studies of Polypyrrole Film Surface Morphology - I. The Influence of Film Thickness and Dopant Nature.” SYNTHETIC METALS 93 (1): 59–64.
Share
Print

Access Document

Publisher copy:: 10.1016/S0379-6779(98)80131-8

Authors

+ Silk, T More by this author

Role:: Author

+ Hong, Q More by this author

Role:: Author

+ Tamm, J More by this author

Role:: Author

+ Compton, R More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Chemistry
Sub department:: Physical & Theoretical Chem
Role:: Author

Journal:: SYNTHETIC METALS More from this journal
Volume:: 93
Issue:: 1
Pages:: 59-64
Publication date:: 1998-02-28
DOI:: 10.1016/S0379-6779(98)80131-8
ISSN:: 0379-6779

Language:: English
Keywords:: polypyrrole

dopant influence

surface morphology

film thickness

atomic force microscopy
UUID:: uuid:52887355-b049-428c-801b-5e0b23ffdac0
Local pid:: pubs:36394
Source identifiers:: 36394
Deposit date:: 2012-12-19

Terms of use

Copyright date:: 1998

Licence:: Terms and Conditions of Use for Oxford University Research Archive

Views and Downloads

About views and downloads

If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP