- Abstract:
-
Over the last few years there have been significant developments in the field of three-dimensional atom probe (3DAP) analysis. This article reviews some of the technical compromises that have led to different instrument designs and the recent improvements in performance. An instrument has now been developed, based around a novel reflectron configuration combining both energy compensation and focusing elements, that yields a large field of view and very high mass resolution. The use of laser p...
Expand abstract - Journal:
- Microscopy and Microanalysis
- Volume:
- 13
- Issue:
- 6
- Pages:
- 408-417
- Publication date:
- 2007-12-05
- DOI:
- EISSN:
-
1435-8115
- ISSN:
-
1431-9276
- URN:
-
uuid:5163a903-1807-43d2-b34d-0430f47c0d9a
- Source identifiers:
-
178518
- Local pid:
- pubs:178518
- Copyright date:
- 2007
Journal article
Overview: Recent progress in three-dimensional atom probe instruments and applications
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