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Overview: Recent progress in three-dimensional atom probe instruments and applications

Abstract:

Over the last few years there have been significant developments in the field of three-dimensional atom probe (3DAP) analysis. This article reviews some of the technical compromises that have led to different instrument designs and the recent improvements in performance. An instrument has now been developed, based around a novel reflectron configuration combining both energy compensation and focusing elements, that yields a large field of view and very high mass resolution. The use of laser p...

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Publisher copy:
10.1017/S143192760707095X

Authors


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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Smith, GDW More by this author
Clifton, PH More by this author
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Journal:
Microscopy and Microanalysis
Volume:
13
Issue:
6
Pages:
408-417
Publication date:
2007-12-05
DOI:
EISSN:
1435-8115
ISSN:
1431-9276
URN:
uuid:5163a903-1807-43d2-b34d-0430f47c0d9a
Source identifiers:
178518
Local pid:
pubs:178518

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