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Extending gate-level diagnosis tools to CMOS intra-gate faults

Publication status:: Published

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APA Style

Fan, X., Moore, W., Hora, C., & Gronthoud, G. (2007). Extending gate-level diagnosis tools to CMOS intra-gate faults. IET COMPUTERS AND DIGITAL TECHNIQUES, 1(6), 685–693.

MLA Style

Fan, X., et al. “Extending Gate-Level Diagnosis Tools to CMOS Intra-Gate Faults.” IET COMPUTERS AND DIGITAL TECHNIQUES, vol. 1, no. 6, 2007, pp. 685–93.

Chicago Style

Fan, X, W Moore, C Hora, and G Gronthoud. 2007. “Extending Gate-Level Diagnosis Tools to CMOS Intra-Gate Faults.” IET COMPUTERS AND DIGITAL TECHNIQUES 1 (6): 685–93.
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Publisher copy:: 10.1049/iet-cdt:20060206

Authors

+ Fan, X More by this author

Role:: Author

+ Moore, W More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Engineering Science
Role:: Author

+ Hora, C More by this author

Role:: Author

+ Gronthoud, G More by this author

Role:: Author

Journal:: IET COMPUTERS AND DIGITAL TECHNIQUES More from this journal
Volume:: 1
Issue:: 6
Pages:: 685-693
Publication date:: 2007-11-01
DOI:: 10.1049/iet-cdt:20060206
ISSN:: 1751-8601

Pubs id:: pubs:64674
UUID:: uuid:4c2630b5-9b99-409e-91c1-3d65e43c2b5f
Local pid:: pubs:64674
Source identifiers:: 64674
Deposit date:: 2013-11-16

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Copyright date:: 2007

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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