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Journal article

Increasing spatial fidelity and SNR of 4D-STEM using multi-frame data fusion

Abstract:
4D-STEM, in which the 2D diffraction plane is captured for each 2D scan position in the scanning transmission electron microscope (STEM) using a pixelated detector, is complementing, and increasingly replacing existing imaging approaches. However, at present the speed of those detectors, although having drastically improved in the recent years, is still 100 to 1,000 times slower than the current PMT technology operators are used to. Regrettably, this means environmental scanning-distortion often limits the overall performance of the recorded 4D data. Here, we present an extension of existing STEM distortion correction techniques for the treatment of 4D data series. Although applicable to 4D data in general, we use electron ptychography and electric-field mapping as model cases and demonstrate an improvement in spatial fidelity, signal-to-noise ratio (SNR), phase precision, and spatial resolution.
Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1017/s1431927621012587

Authors

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Oxford college:
Corpus Christi College
Role:
Author
ORCID:
0000-0002-5883-6463
More by this author
Role:
Author
ORCID:
0000-0002-6907-0731


Publisher:
Cambridge University Press
Journal:
Microscopy and Microanalysis More from this journal
Volume:
28
Issue:
4
Pages:
1417 - 1427
Publication date:
2021-09-15
Acceptance date:
2021-08-12
DOI:
EISSN:
1435-8115
ISSN:
1431-9276


Language:
English
Keywords:
Pubs id:
1196028
Local pid:
pubs:1196028
Deposit date:
2021-09-27
ARK identifier:

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