A review of recent in situ deformation studies using synchrotron X-ray (Micro) beams

Journal article

The advent of (sub)microscopic focused X-ray beams at third generation synchrotron sources has opened up possibilities for the characterisation of material structure and mechanical behaviour with unprecedented spatial resolution. Crucially, the non-destructive nature and fast rate of X-ray data collection allow in situ deformation to be studied. In this review, we concentrate on the inelastic deformation response of ductile metallic (poly)crystals. We describe a range of diffraction-based techniques we have developed including monochromatic beam reciprocal space mapping, scanning "pink" beam micro-diffraction compound topography, and white beam Laue micro-diffraction. We compare the results obtained using each of the above techniques, and assess and review the insights that they afford into micro-scale material deformation. © 2012 Bentham Science Publishers.

Authors: Korsunsky, A; Hofmann, F; Song, X; Abbey, B; Baimpas, N

• Journal: Micro and Nanosystems
• Volume: 4
• Issue: 2
• Pages: 97-105
• Publication date: 2012-06-01
• DOI: 10.2174/1876402911204020097
• EISSN: 1876-4037
• ISSN: 1876-4029
• Language: English
• Keywords: Synchrotron; Dislocation; Micro-beam; X-ray diffraction