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High-resolution inelastic x-ray scattering at the high energy density scientific instrument at the European X-Ray Free-Electron Laser

Abstract:
We introduce a setup to measure high-resolution inelastic x-ray scattering at the High Energy Density scientific instrument at the European X-Ray Free-Electron Laser (XFEL). The setup uses the Si (533) reflection in a channel-cut monochromator and three spherical diced analyzer crystals in near-backscattering geometry to reach a high spectral resolution. An energy resolution of 44 meV is demonstrated for the experimental setup, close to the theoretically achievable minimum resolution. The analyzer crystals and detector are mounted on a curved-rail system, allowing quick and reliable changes in scattering angle without breaking vacuum. The entire setup is designed for operation at 10 Hz, the same repetition rate as the high-power lasers available at the instrument and the fundamental repetition rate of the European XFEL. Among other measurements, it is envisioned that this setup will allow studies of the dynamics of highly transient laser generated states of matter.
Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1063/5.0022886

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Role:
Author
ORCID:
0000-0002-6934-1108
More by this author
Role:
Author
ORCID:
0000-0003-1708-6376


Publisher:
American Institute of Physics
Journal:
Review of Scientific Instruments More from this journal
Volume:
92
Issue:
1
Article number:
013101
Publication date:
2021-01-04
Acceptance date:
2020-12-12
DOI:
EISSN:
1089-7623
ISSN:
0034-6748


Language:
English
Keywords:
Pubs id:
1158899
Local pid:
pubs:1158899
Deposit date:
2021-02-01

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