Journal article icon

Journal article

X-ray micro-beam characterization of lattice rotations and distortions due to an individual dislocation.

Abstract:

Understanding and controlling the behaviour of dislocations is crucial for a wide range of applications, from nano-electronics and solar cells to structural engineering alloys. Quantitative X-ray diffraction measurements of the strain fields due to individual dislocations, particularly in the bulk, however, have thus far remained elusive. Here we report the first characterization of a single dislocation in a freestanding GaAs/In0.2Ga0.8As/GaAs membrane by synchrotron X-ray micro-beam Laue dif...

Expand abstract
Publication status:
Published

Actions


Access Document


Publisher copy:
10.1038/ncomms3774

Authors


More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Engineering Science
Expand authors...
Publisher:
Nature Publishing Group
Journal:
Nature communications
Volume:
4
Pages:
2774
Publication date:
2013
DOI:
EISSN:
2041-1723
ISSN:
2041-1723
URN:
uuid:40c185c0-4902-49df-9785-9485b08424bf
Source identifiers:
438982
Local pid:
pubs:438982
Language:
English

Terms of use


Metrics



If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP