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Atomic scale characterization of buried In(x)Ga(1-x)As quantum dots using pulsed laser atom probe tomography

Publication status:: Published

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APA Style

Mueller, M., Cerezo, A., Smith, G., Chang, L., & Gerstl, S. (2008). Atomic scale characterization of buried In(x)Ga(1-x)As quantum dots using pulsed laser atom probe tomography. APPLIED PHYSICS LETTERS, 92(23), 233115–233115.

MLA Style

Mueller, M., et al. “Atomic Scale Characterization of Buried In(x)Ga(1-x)As Quantum Dots Using Pulsed Laser Atom Probe Tomography.” APPLIED PHYSICS LETTERS, vol. 92, no. 23, 2008, pp. 233115–15.

Chicago Style

Mueller, M, A Cerezo, G Smith, L Chang, and S Gerstl. 2008. “Atomic Scale Characterization of Buried In(x)Ga(1-x)As Quantum Dots Using Pulsed Laser Atom Probe Tomography.” APPLIED PHYSICS LETTERS 92 (23): 233115–15.
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Publisher copy:: 10.1063/1.2918846

Authors

+ Mueller, M More by this author

Role:: Author

+ Cerezo, A More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Materials
Role:: Author

+ Smith, G More by this author

Role:: Author

+ Chang, L More by this author

Role:: Author

+ Gerstl, S More by this author

Role:: Author

Journal:: APPLIED PHYSICS LETTERS More from this journal
Volume:: 92
Issue:: 23
Pages:: 233115-233115
Publication date:: 2008-06-09
DOI:: 10.1063/1.2918846
ISSN:: 0003-6951

Pubs id:: pubs:29937
UUID:: uuid:3b2a61c6-0a09-4e5d-9102-2312c1f08742
Local pid:: pubs:29937
Source identifiers:: 29937
Deposit date:: 2012-12-19

Terms of use

Copyright date:: 2008

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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