- Abstract:
-
Imaging the complete atomic structure of materials, including light elements, with minimal beam-induced damage of the sample is a long-standing challenge in electron microscopy. Annular bright-field scanning transmission electron microscopy is often used to image elements with low atomic numbers, but due to its low efficiency and high sensitivity to precise imaging parameters it comes at the price of potentially significant beam damage. In this paper, we show that electron ptychography is a p...
Expand abstract - Publication status:
- Published
- Peer review status:
- Peer reviewed
- Version:
- Publisher's Version
- Files:
-
-
(pdf, 7.7mb)
-
- Publisher copy:
- 10.1021/acs.nanolett.8b02718
-
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- Funding agency for:
- Bruce, PG
- Publisher:
- American Chemical Society Publisher's website
- Journal:
- Nano Letters Journal website
- Volume:
- 18
- Issue:
- 11
- Pages:
- 6850–6855
- Publication date:
- 2018-09-26
- Acceptance date:
- 2018-09-27
- DOI:
- EISSN:
-
1530-6992
- ISSN:
-
1530-6984
- Pubs id:
-
pubs:923161
- URN:
-
uri:3983b076-605e-4b3b-bdee-2c0696fc9937
- UUID:
-
uuid:3983b076-605e-4b3b-bdee-2c0696fc9937
- Local pid:
- pubs:923161
- Keywords:
- Copyright holder:
- American Chemical Society
- Copyright date:
- 2018
- Notes:
- © American Chemical Society. This is an open access article published under a Creative Commons Attribution (CC-BY) License, which permits unrestricted use, distribution and reproduction in any medium, provided the author and source are cited.
Journal article
Low-dose aberration-free imaging of Li-rich cathode materials at various states of charge using electron ptychography
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