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Low-dose aberration-free imaging of Li-rich cathode materials at various states of charge using electron ptychography

Abstract:

Imaging the complete atomic structure of materials, including light elements, with minimal beam-induced damage of the sample is a long-standing challenge in electron microscopy. Annular bright-field scanning transmission electron microscopy is often used to image elements with low atomic numbers, but due to its low efficiency and high sensitivity to precise imaging parameters it comes at the price of potentially significant beam damage. In this paper, we show that electron ptychography is a p...

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Publication status:
Published
Peer review status:
Peer reviewed
Version:
Publisher's Version

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Publisher copy:
10.1021/acs.nanolett.8b02718

Authors


More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Oxford college:
Corpus Christi College
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Oxford college:
Corpus Christi College
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Subgroup:
Vice-chancellor & Registrar
Oxford college:
St Edmund Hall
Publisher:
American Chemical Society Publisher's website
Journal:
Nano Letters Journal website
Volume:
18
Issue:
11
Pages:
6850–6855
Publication date:
2018-09-26
Acceptance date:
2018-09-27
DOI:
EISSN:
1530-6992
ISSN:
1530-6984
Pubs id:
pubs:923161
URN:
uri:3983b076-605e-4b3b-bdee-2c0696fc9937
UUID:
uuid:3983b076-605e-4b3b-bdee-2c0696fc9937
Local pid:
pubs:923161

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