Journal article
Nano-scale residual stress profiling in thin multilayer films with non-equibiaxial stress state
- Abstract:
-
Silver-based low-emissivity (low-E) coatings are applied on architectural glazing to cost-effectively reduce heat losses, as they generally consist of dielectric/Ag/dielectric multilayer stacks, where the thin Ag layer reflects long- wavelength infrared (IR), while the dielectric layers both protect the Ag and act as an anti-reflective barrier. The architecture of the multilayer stack influences its mechanical properties and it is strongly dependent on the residual stress distribution in the ...
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- Publication status:
- Published
- Peer review status:
- Peer reviewed
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Authors
Funding
European Commission
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Bibliographic Details
- Publisher:
- MDPI Publisher's website
- Journal:
- Nanomaterials Journal website
- Volume:
- 10
- Issue:
- 5
- Publication date:
- 2020-04-28
- Acceptance date:
- 2020-04-24
- DOI:
- EISSN:
-
2079-4991
- ISSN:
-
2079-4991
- Pmid:
-
32354141
Item Description
- Language:
- English
- Keywords:
- Pubs id:
-
1103637
- Local pid:
- pubs:1103637
- Deposit date:
- 2020-05-22
Terms of use
- Copyright holder:
- Sebastiani et al.
- Copyright date:
- 2020
- Rights statement:
- © 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
- Licence:
- CC Attribution (CC BY)
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