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Temperature Dependence of Fixed Pattern Noise in Logarithmic CMOS Image Sensors

Publication status:
Published

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Publisher copy:
10.1109/TIM.2009.2014618

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Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
Volume:
58
Issue:
8
Pages:
2503-2511
Host title:
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Publication date:
2009-08-01
DOI:
EISSN:
1557-9662
ISSN:
0018-9456
Source identifiers:
64729
Keywords:
Pubs id:
pubs:64729
UUID:
uuid:34b538fb-642e-48e3-b808-51a8dcf31933
Local pid:
pubs:64729
Deposit date:
2012-12-19

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