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Temperature Dependence of Fixed Pattern Noise in Logarithmic CMOS Image Sensors

Publication status:: Published

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APA Style

Joseph, D., & Collins, S. (2009). Temperature Dependence of Fixed Pattern Noise in Logarithmic CMOS Image Sensors. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 58(8), 2503–2511.

MLA Style

Joseph, D., and S. Collins. “Temperature Dependence of Fixed Pattern Noise in Logarithmic CMOS Image Sensors.” IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, vol. 58, no. 8, 2009, pp. 2503–11.

Chicago Style

Joseph, D, and S Collins. 2009. “Temperature Dependence of Fixed Pattern Noise in Logarithmic CMOS Image Sensors.” In IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 58:2503–11.
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Publisher copy:: 10.1109/TIM.2009.2014618

Authors

+ Joseph, D More by this author

Role:: Author

+ Collins, S More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Engineering Science
Role:: Author

Host title:: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Volume:: 58
Issue:: 8
Pages:: 2503-2511
Publication date:: 2009-08-01
DOI:: 10.1109/TIM.2009.2014618
EISSN:: 1557-9662
ISSN:: 0018-9456

Keywords:: modeling

logarithmic response

complimentary metal-oxide-semiconductor (CMOS) image sensors

fixed pattern noise (FPN)

temperature dependence

Calibration
Pubs id:: pubs:64729
UUID:: uuid:34b538fb-642e-48e3-b808-51a8dcf31933
Local pid:: pubs:64729
Source identifiers:: 64729
Deposit date:: 2012-12-19

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Copyright date:: 2009

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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