Diffusion distribution model for damage mitigation in scanning transmission electron microscopy

Journal article

Despite the widespread use of Scanning Transmission Electron Microscopy (STEM) for observing the structure of materials at the atomic scale, a detailed understanding of some relevant electron beam damage mechanisms is limited. Recent reports suggest that certain types of damage can be modelled as a diffusion process and that the accumulation effects of this process must be kept low in order to reduce damage. We therefore develop an explicit mathematical formulation of spatiotemporal diffusion processes in STEM that take into account both instrument and sample parameters. Furthermore, our framework can aid the design of Diffusion Controlled Sampling (DCS) strategies using optimally selected probe positions in STEM, that constrain the cumulative diffusion distribution. Numerical simulations highlight the variability of the cumulative diffusion distribution for different experimental STEM configurations. These analytical and numerical frameworks can subsequently be used for careful design of 2‐ and 4‐dimensional STEM experiments where beam damage is minimised.

Authors: Moshtaghpour, A; Velazco‐Torrejon, A; Nicholls, D; Robinson, AW; Kirkland, AI

• Publication status: Published
• Peer review status: Peer reviewed
• Publisher: Wiley
• Journal: Journal of Microscopy
• Publication date: 2024-08-21
• Acceptance date: 2024-07-29
• DOI: 10.1111/jmi.13351
• EISSN: 1365-2818
• ISSN: 0022-2720, 1365-2818
• Language: English
• Keywords: scanning transmission electron microscopy; diffusion distribution; beam damage; compressive sensing