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Determining the C60 molecular arrangement in thin films by means of X-ray diffraction

Abstract:

The electrical and optical properties of molecular thin films are widely used, for instance in organic electronics, and depend strongly on the molecular arrangement of the organic layers. It is shown here how atomic structural information can be obtained from molecular films without further knowledge of the single-crystal structure. C60 fullerene was chosen as a representative test material. A 250 nm C60 film was investigated by grazing-incidence X-ray diffraction and the data compared with a...

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Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1107/S002188981103531X

Authors


Elschner, C More by this author
Grenzer, J More by this author
Schroer, C More by this author
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Publisher:
International Union of Crystallography Publisher's website
Journal:
Journal of Applied Crystallography Journal website
Volume:
44
Issue:
5
Pages:
983-990
Publication date:
2011-10-05
DOI:
EISSN:
1600-5767
ISSN:
0021-8898
URN:
uuid:305b1ab6-924d-4752-9492-687ca1021621
Source identifiers:
405366
Local pid:
pubs:405366

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