Conference icon

Conference

Corona charge in SiO2: kinetics and surface passivation for high efficiency silicon solar cells

Abstract:

This manuscript presents a method by which capacitance-voltage measurements can be used in conjunction with Kelvin-probe measurements to calculate the location of charge within a dielectric layer. A first order kinetic model for the transport of charge into SiO 2 films after exposure to corona charge deposition is proposed. The rate limiting step for charge migration into oxide films has been observed to be the injection of charge from the surface (air -SiO2 interface). The charge lies pr...

Expand abstract
Publication status:
Published
Peer review status:
Peer reviewed
Version:
Publisher's version

Actions


Access Document


Files:
Publisher copy:
10.1016/j.egypro.2016.07.090

Authors


More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Clayton-Warwick, D More by this author
Expand authors...
More from this funder
Funding agency for:
Collett, KA
Publisher:
Elsevier Publisher's website
Publication date:
2016-09-05
Acceptance date:
2016-04-22
DOI:
URN:
uuid:2fc6a4e7-2332-45c9-b23f-780b74b1137f
Source identifiers:
617450
Local pid:
pubs:617450

Terms of use


Metrics



If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP