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Delayed pull-in transitions in overdamped MEMS devices

Abstract:
We consider the dynamics of overdamped MEMS devices undergoing the pull-in instability. Numerous previous experiments and numerical simulations have shown a significant increase in the pull-in time under DC voltages close to the pull-in voltage. Here the transient dynamics slow down as the device passes through a meta-stable or bottleneck phase, but this slowing down is not well understood quantitatively. Using a lumped parallel-plate model, we perform a detailed analysis of the pull-in dynamics in this regime. We show that the bottleneck phenomenon is a type of critical slowing down arising from the pullin transition. This allows us to show that the pull-in time obeys an inverse square-root scaling law as the transition is approached; moreover we determine an analytical expression for this pull-in time. We then compare our prediction to a wide range of pull-in time data reported in the literature, showing that the observed slowing down is well captured by our scaling law, which appears to be generic for overdamped pull-in under DC loads. This realization provides a useful design rule with which to tune dynamic response in applications, including stateof-the-art accelerometers and pressure sensors that use pull-in time as a sensing mechanism. We also propose a method to estimate the pull-in voltage based only on data of the pull-in times.
Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1088/1361-6439/aa9a70

Authors


More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Mathematical Institute
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Mathematical Institute
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Mathematical Institute
Oxford college:
Lincoln College
Role:
Author


Publisher:
IOP Publishing
Journal:
Journal of Micromechanics and Microengineering More from this journal
Volume:
28
Issue:
1
Pages:
015006
Publication date:
2017-12-12
Acceptance date:
2017-11-14
DOI:
EISSN:
1361-6439
ISSN:
0960-1317


Keywords:
Pubs id:
pubs:742591
UUID:
uuid:2d402c57-8e03-44b3-ba85-fd992f0b6560
Local pid:
pubs:742591
Source identifiers:
742591
Deposit date:
2017-11-03

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