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POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES

Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author


Journal:
MICROSCOPY OF SEMICONDUCTING MATERIALS 1989 More from this journal
Volume:
100
Pages:
75-80
Publication date:
1989-01-01
Event title:
CONF ON MICROSCOPY OF SEMICONDUCTING MATERIALS
ISBN:
0854980563


Pubs id:
pubs:19150
UUID:
uuid:2aee8c9b-42b4-4f8c-9ad5-85beb0e5c3af
Local pid:
pubs:19150
Source identifiers:
19150
Deposit date:
2012-12-19

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