Conference item
POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
- Publication status:
- Published
Actions
Authors
- Journal:
- MICROSCOPY OF SEMICONDUCTING MATERIALS 1989 More from this journal
- Volume:
- 100
- Pages:
- 75-80
- Publication date:
- 1989-01-01
- Event title:
- CONF ON MICROSCOPY OF SEMICONDUCTING MATERIALS
- ISBN:
- 0854980563
- Pubs id:
-
pubs:19150
- UUID:
-
uuid:2aee8c9b-42b4-4f8c-9ad5-85beb0e5c3af
- Local pid:
-
pubs:19150
- Source identifiers:
-
19150
- Deposit date:
-
2012-12-19
Terms of use
- Copyright date:
- 1989
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