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Comparative STM and RHEED studies of Ge/Si(001) and Si/Ge/Si(001) surfaces

Publication status:
Published

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Authors


Goldfarb, I More by this author
Briggs, GAD More by this author
Volume:
433
Pages:
449-454
Publication date:
1999-08-02
DOI:
ISSN:
0039-6028
URN:
uuid:29626fea-37b0-4d7d-86a8-4fe40e735ed7
Source identifiers:
174554
Local pid:
pubs:174554

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