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Comparative STM and RHEED studies of Ge/Si(001) and Si/Ge/Si(001) surfaces

Publication status:: Published

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APA Style

Goldfarb, I., & Briggs, G. (1999). Comparative STM and RHEED studies of Ge/Si(001) and Si/Ge/Si(001) surfaces. SURFACE SCIENCE, 433, 449–454.

MLA Style

Goldfarb, I., and G. Briggs. “Comparative STM and RHEED Studies of Ge/Si(001) and Si/Ge/Si(001) Surfaces.” SURFACE SCIENCE, vol. 433, 1999, pp. 449–54.

Chicago Style

Goldfarb, I, and G Briggs. 1999. “Comparative STM and RHEED Studies of Ge/Si(001) and Si/Ge/Si(001) Surfaces.” In SURFACE SCIENCE, 433:449–54.
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Publisher copy:: 10.1016/S0039-6028(99)00113-2

Authors

+ Goldfarb, I More by this author

Role:: Author

+ Briggs, G More by this author

Role:: Author

Host title:: SURFACE SCIENCE
Volume:: 433
Pages:: 449-454
Publication date:: 1999-08-02
DOI:: 10.1016/S0039-6028(99)00113-2
ISSN:: 0039-6028

Keywords:: germanium

reflection high-energy electron diffraction

scanning tunneling microscopy

silicon

epitaxy

surface structure, morphology, roughness and topography
Pubs id:: pubs:174554
UUID:: uuid:29626fea-37b0-4d7d-86a8-4fe40e735ed7
Local pid:: pubs:174554
Source identifiers:: 174554
Deposit date:: 2012-12-19

Terms of use

Copyright date:: 1999

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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