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Journal article

Time-resolved retardance and optic-axis angle measurement system for characterization of flexoelectro-optic liquid crystal and other birefringent devices

Abstract:

A new polarimeter is presented which gives time-resolved measurements of both the optic-axis angle and the linear phase retardation for modulated birefringent optical devices. It is suitable for characterizing dynamic waveplate devices based on liquid crystal and other materials. It is fully automated and requires no angular alignment of the device under test. The system has an absolute angle error of <±0.3° and a retardance error of <±0.44°, with considerably better relative accuracy. ...

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Publication status:
Published
Peer review status:
Peer reviewed
Version:
Publisher's version

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Publisher copy:
10.1364/OE.26.006126

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More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Engineering Science
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Engineering Science
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Engineering Science
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Engineering Science
Oxford college:
Jesus College
Role:
Author
More from this funder
Funding agency for:
Morris, SM
Publisher:
Optical Society of America Publisher's website
Journal:
Optics Express Journal website
Volume:
26
Issue:
5
Pages:
6126-6142
Publication date:
2018-02-28
Acceptance date:
2018-02-01
DOI:
ISSN:
1094-4087
Pubs id:
pubs:822375
URN:
uri:28be7074-26b8-4807-bbd9-841b3f908f83
UUID:
uuid:28be7074-26b8-4807-bbd9-841b3f908f83
Local pid:
pubs:822375
Paper number:
5

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