- Abstract:
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A new polarimeter is presented which gives time-resolved measurements of both the optic-axis angle and the linear phase retardation for modulated birefringent optical devices. It is suitable for characterizing dynamic waveplate devices based on liquid crystal and other materials. It is fully automated and requires no angular alignment of the device under test. The system has an absolute angle error of <±0.3° and a retardance error of <±0.44°, with considerably better relative accuracy. ...
Expand abstract - Publication status:
- Published
- Peer review status:
- Peer reviewed
- Version:
- Publisher's version
- Files:
-
-
(pdf, 4.7MB)
-
- Publisher copy:
- 10.1364/OE.26.006126
-
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- Publisher:
- Optical Society of America Publisher's website
- Journal:
- Optics Express Journal website
- Volume:
- 26
- Issue:
- 5
- Pages:
- 6126-6142
- Publication date:
- 2018-02-28
- Acceptance date:
- 2018-02-01
- DOI:
- ISSN:
-
1094-4087
- Pubs id:
-
pubs:822375
- URN:
-
uri:28be7074-26b8-4807-bbd9-841b3f908f83
- UUID:
-
uuid:28be7074-26b8-4807-bbd9-841b3f908f83
- Local pid:
- pubs:822375
- Paper number:
- 5
- Copyright holder:
- Fells et al.
- Copyright date:
- 2018
- Notes:
-
Published by The Optical Society under the terms of the Creative Commons Attribution 4.0 License. Further
distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation,
and DOI.
Journal article
Time-resolved retardance and optic-axis angle measurement system for characterization of flexoelectro-optic liquid crystal and other birefringent devices
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