Journal article
High-Fidelity Preparation, Gates, Memory, and Readout of a Trapped-Ion Quantum Bit.
- Abstract:
- We implement all single-qubit operations with fidelities significantly above the minimum threshold required for fault-tolerant quantum computing, using a trapped-ion qubit stored in hyperfine "atomic clock" states of ^{43}Ca^{+}. We measure a combined qubit state preparation and single-shot readout fidelity of 99.93%, a memory coherence time of T_{2}^{*}=50 sec, and an average single-qubit gate fidelity of 99.9999%. These results are achieved in a room-temperature microfabricated surface trap, without the use of magnetic field shielding or dynamic decoupling techniques to overcome technical noise.
- Publication status:
- Published
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Authors
- Publisher:
- American Physical Society
- Journal:
- Physical Review Letters More from this journal
- Volume:
- 113
- Issue:
- 22
- Pages:
- 220501
- Publication date:
- 2014-11-01
- DOI:
- EISSN:
-
1079-7114
- ISSN:
-
0031-9007
- Language:
-
English
- Keywords:
- Pubs id:
-
pubs:456220
- UUID:
-
uuid:2676aa0e-490e-44db-8135-8baa6ef20028
- Local pid:
-
pubs:456220
- Source identifiers:
-
456220
- Deposit date:
-
2014-12-19
Terms of use
- Copyright date:
- 2014
- Notes:
- Supplementary Information included. 6 nines, 7 figures, 8 pages
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