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Journal article

Applying grazing incidence X-ray reflectometry (XRR) to characterising nanofilms on mica.

Abstract:

Molecularly smooth mica has hitherto not been widely used as a substrate for the X-ray reflectometry (XRR) technique. That is largely due to the difficulty of achieving flatness over a sufficiently large area of mica. Here we show that this difficulty can be overcome by slightly bending the mica substrate over an underlying cylinder; the enhanced rigidity of the bent mica sheet along the axis of the cylinder provides sufficient flatness along this axis for XRR measurements. To test this metho...

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Publication status:
Published

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Publisher copy:
10.1016/j.jcis.2006.10.031

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Institution:
University of Oxford
Division:
MPLS
Department:
Chemistry
Sub department:
Physical & Theoretical Chem
Role:
Author
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Journal:
Journal of colloid and interface science
Volume:
306
Issue:
2
Pages:
459-463
Publication date:
2007-02-01
DOI:
EISSN:
1095-7103
ISSN:
0021-9797
Source identifiers:
33679
Language:
English
Keywords:
Pubs id:
pubs:33679
UUID:
uuid:1f259544-df82-40da-8b57-664861f1a639
Local pid:
pubs:33679
Deposit date:
2012-12-19

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