Applying grazing incidence X-ray reflectometry (XRR) to characterising nanofilms on mica.

Journal article

Molecularly smooth mica has hitherto not been widely used as a substrate for the X-ray reflectometry (XRR) technique. That is largely due to the difficulty of achieving flatness over a sufficiently large area of mica. Here we show that this difficulty can be overcome by slightly bending the mica substrate over an underlying cylinder; the enhanced rigidity of the bent mica sheet along the axis of the cylinder provides sufficient flatness along this axis for XRR measurements. To test this metho...

Expand abstract

Authors: Briscoe, W; Chen, M; Dunlop, I; Klein, J; Penfold, J

• Publication status: Published
• Journal: Journal of colloid and interface science
• Volume: 306
• Issue: 2
• Pages: 459-463
• Publication date: 2007-02-01
• DOI: 10.1016/j.jcis.2006.10.031
• EISSN: 1095-7103
• ISSN: 0021-9797
• Language: English
• Keywords: surface characterisation; nanofilms; thin films; surface-grown polymer brushes; mica; X-ray reflectometry; XRR