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SOME ASPECTS OF ATOM-PROBE ANALYSIS OF FE-C AND FE-N SYSTEMS

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APA Style

Sha, W., Chang, L., Smith, G., Liu, C., & Mittemeijer, E. (1992). SOME ASPECTS OF ATOM-PROBE ANALYSIS OF FE-C AND FE-N SYSTEMS. 38TH INTERNATIONAL FIELD EMISSION SYMP : FIELD EMISSION 91, 266(1-3), 416–423.

MLA Style

Sha, W, et al. “SOME ASPECTS OF ATOM-PROBE ANALYSIS OF FE-C AND FE-N SYSTEMS.” 38TH INTERNATIONAL FIELD EMISSION SYMP : FIELD EMISSION 91, vol. 266, nos. 1-3, 1992, pp. 416–23.

Chicago Style

Sha, W, L Chang, G Smith, C Liu, and E Mittemeijer. 1992. “SOME ASPECTS OF ATOM-PROBE ANALYSIS OF FE-C AND FE-N SYSTEMS.” In 38TH INTERNATIONAL FIELD EMISSION SYMP : FIELD EMISSION 91, 266:416–23.
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Publisher copy:: 10.1016/0039-6028(92)91055-G

Authors

+ Sha, W More by this author

Role:: Author

+ Chang, L More by this author

Role:: Author

+ Smith, G More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Materials
Role:: Author

+ Liu, C More by this author

Role:: Author

+ Mittemeijer, E More by this author

Role:: Author

Journal:: SURFACE SCIENCE More from this journal
Volume:: 266
Issue:: 1-3
Pages:: 416-423
Publication date:: 1992-04-15
Event title:: 38TH INTERNATIONAL FIELD EMISSION SYMP : FIELD EMISSION 91
DOI:: 10.1016/0039-6028(92)91055-G
ISSN:: 0039-6028

Keywords:: SILICON

CARBON

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CLUSTER IONS
Pubs id:: pubs:2810
UUID:: uuid:1ea9f3ea-166e-45ab-acb7-da45b91986a0
Local pid:: pubs:2810
Source identifiers:: 2810
Deposit date:: 2012-12-19
ARK identifier:: ark:/29072/ora_1ea9f3ea166e45abacb7da45b91986a0

Terms of use

Copyright date:: 1992

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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