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The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements

Version:
1

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Publisher copy:
10.5281/zenodo.17144

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Department:
Imperial College London
Role:
Creator
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Department:
Imperial College London
Role:
Creator
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Department:
Imperial College London
Role:
Creator

Contributors

Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Principal Investigator (PI)
Publisher:
Zenodo
Publication date:
2015
Digital storage location:
http://dx.doi.org/10.5281/zenodo.17144
Version number:
1
DOI:
Data collected:
2014 - 2014
Language:
English
Keywords:
Subjects:
Documentation:
Data examining the spatial resolution of electron backscatter diffraction. EBSD patterns were obtained from a Zr alloy (zircaloy-4) using a Bruker eFlashHR detector at full 1600x1152 pixel resolution on an Zeiss Auriga SEM at 20keV and 10nA. Cross correlation analysis carried out within Matlab was used to measure the degree of pattern overlap and its effects on errors in strain measurements. High resolution, cross-correlation based, electron backscatter diffraction (EBSD) measures the variat... Expand documentation
UUID:
uuid:1beb8985-6961-4aa7-ae42-247a41f3158a
Deposit date:
2015-07-05

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