Dataset
The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements
- Documentation:
- Data examining the spatial resolution of electron backscatter diffraction. EBSD patterns were obtained from a Zr alloy (zircaloy-4) using a Bruker eFlashHR detector at full 1600x1152 pixel resolution on an Zeiss Auriga SEM at 20keV and 10nA. Cross correlation analysis carried out within Matlab was used to measure the degree of pattern overlap and its effects on errors in strain measurements. High resolution, cross-correlation based, electron backscatter diffraction (EBSD) measures the variation of elastics trains and lattice rotations from a reference state. Regions near grain boundaries are often of interest but overlap of patterns from the two grains could reduce accuracy of the cross-correlation analysis. To explore this concern, patterns from the interior of two grains have been mixed to simulate the interaction volume crossing a grain boundary so that the effect on the accuracy of the cross-correlation results can be tested. It was found that the accuracy of HR-EBSD strain measurements performed in a FEGSEM on zirconium remains good until the incident beam is less than 18nm from a grain boundary. A simulated microstructure was used to measure how often pattern overlap occurs at any given EBSD step size, and a simple relation was found linking the probability of overlap with step size.
- Version:
- 1
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- Publisher copy:
- 10.5281/zenodo.17144
Authors/Creators
Contributors
+ Wilkinson, A
- Institution:
- University of Oxford
- Division:
- MPLS
- Department:
- Materials
- Role:
- Principal Investigator (PI)
- Publisher:
- Zenodo
- Publication date:
- 2015
- Digital storage location:
- http://dx.doi.org/10.5281/zenodo.17144
- Version number:
- 1
- DOI:
- Data collected:
- 2014 - 2014
- Language:
-
English
- Keywords:
- Subjects:
- Pubs id:
-
1479963
- UUID:
-
uuid:1beb8985-6961-4aa7-ae42-247a41f3158a
- Local pid:
-
pubs:1479963
- Deposit date:
-
2015-07-09
- ARK identifier:
Terms of use
- Copyright date:
- 2016
- Licence:
- Bespoke licence
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