Dataset
The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements
- Version:
- 1
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- Publisher copy:
- 10.5281/zenodo.17144
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Authors/Creators
Contributors
+ Wilkinson, A
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Principal Investigator (PI)
Funding
Bibliographic Details
- Publisher:
- Zenodo
- Publication date:
- 2015
- Digital storage location:
- http://dx.doi.org/10.5281/zenodo.17144
- Version number:
- 1
- DOI:
- Data collected:
- 2014 - 2014
Item Description
- Language:
- English
- Keywords:
- Subjects:
- Documentation:
-
Data examining the spatial resolution of electron backscatter diffraction. EBSD patterns were obtained from a Zr alloy (zircaloy-4) using a Bruker eFlashHR detector at full 1600x1152 pixel resolution on an Zeiss Auriga SEM at 20keV and 10nA. Cross correlation analysis carried out within Matlab was used to measure the degree of pattern overlap and its effects on errors in strain measurements. High resolution, cross-correlation based, electron backscatter diffraction (EBSD) measures the variat... Expand documentation
- UUID:
-
uuid:1beb8985-6961-4aa7-ae42-247a41f3158a
- Deposit date:
- 2015-07-05
Related Items
Terms of use
- Copyright date:
- 2016
- Licence:
- Bespoke licence
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