High resolution, cross-correlation based, electron backscatter diffraction (EBSD) measures the variation of elastics trains and lattice rotations from a reference state. Regions near grain boundaries are often of interest but overlap of patterns from the two grains could reduce accuracy of the cross-correlation analysis. To explore this concern, patterns from the interior of two grains have been mixed to simulate the interaction volume crossing a grain boundary so that the effect on the accur...Expand abstract
- Publisher copy:
- Data examining the spatial resolution of electron backscatter diffraction. EBSD patterns were obtained from a Zr alloy (zircaloy-4) using a Bruker eFlashHR detector at full 1600x1152 pixel resolution on an Zeiss Auriga SEM at 20keV and 10nA. Cross correlation analysis carried out within Matlab was used to measure the degree of pattern overlap and its effects on errors in strain measurements.
- Copyright date:
- Bespoke licence
The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements
Views and Downloads
If you are the owner of this record, you can report an update to it here: Report update to this record