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The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements

Abstract:

High resolution, cross-correlation based, electron backscatter diffraction (EBSD) measures the variation of elastics trains and lattice rotations from a reference state. Regions near grain boundaries are often of interest but overlap of patterns from the two grains could reduce accuracy of the cross-correlation analysis. To explore this concern, patterns from the interior of two grains have been mixed to simulate the interaction volume crossing a grain boundary so that the effect on the accur...

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Publisher copy:
10.5281/zenodo.17144

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Department:
Imperial College London
Role:
Creator
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Department:
Imperial College London
Role:
Creator
More by this author/creator
Department:
Imperial College London
Role:
Creator

Contributors

Department:
Materials, University of Oxford
Role:
Principal Investigator
Publisher:
Zenodo
Publication date:
2015
Data location:
http://dx.doi.org/10.5281/zenodo.17144
DOI:
Data collected:
2014 - 2014
Language:
English
Keywords:
Subjects:
Format:
Digital
Documentation:
Data examining the spatial resolution of electron backscatter diffraction. EBSD patterns were obtained from a Zr alloy (zircaloy-4) using a Bruker eFlashHR detector at full 1600x1152 pixel resolution on an Zeiss Auriga SEM at 20keV and 10nA. Cross correlation analysis carried out within Matlab was used to measure the degree of pattern overlap and its effects on errors in strain measurements.

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