Journal article

In-situ electron microscope observations and analysis of radiation damage in tungsten

Publication status:: Accepted

Peer review status:: Peer reviewed

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APA Style

Yi, X., Jenkins, M., Kirk, M., & Roberts, S. (2015). In-situ electron microscope observations and analysis of radiation damage in tungsten. Microscopy and Microanalysis, 21(53), 117–118.

MLA Style

Yi, X., et al. “In-Situ Electron Microscope Observations and Analysis of Radiation Damage in Tungsten.” Microscopy and Microanalysis, vol. 21, no. 53, Cambridge University Press, 2015, pp. 117–18.

Chicago Style

Yi, X, M Jenkins, M Kirk, and S Roberts. 2015. “In-Situ Electron Microscope Observations and Analysis of Radiation Damage in Tungsten.” Microscopy and Microanalysis 21 (53): 117–18.
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Files:: 15-12 - In-situ EM observations and analysis of radiation dama...

(Preview, Accepted manuscript, pdf, 275.6KB, Terms of use)

Publisher copy:: 10.1017/S1431927615001385

Authors

+ Yi, X More by this author

Role:: Author

+ Jenkins, M More by this author

Role:: Author

+ Kirk, M More by this author

Role:: Author

+ Roberts, S More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Materials
Role:: Author

Publisher:: Cambridge University Press
Journal:: Microscopy and Microanalysis More from this journal
Volume:: 21
Issue:: 53
Pages:: 117-118
Publication date:: 2015-08-01
DOI:: 10.1017/S1431927615001385
EISSN:: 1435-8115
ISSN:: 1431-9276

Keywords:: SBTMR
Pubs id:: pubs:623782
UUID:: uuid:1b9beafe-7208-4b33-8d70-633de615d8cb
Local pid:: pubs:623782
Source identifiers:: 623782
Deposit date:: 2016-05-24

Terms of use

Copyright holder:: Microscopy Society of America
Copyright date:: 2015
Notes:: This is the
accepted manuscript of a journal article published by Cambridge University Press on behalf of The Microscopy Society of America in Microscopy and Microanalysis in August 2015, available online: http://dx.doi.org/10.1017/S1431927615001385

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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