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Atomic resolution defocused electron ptychography at low dose with a fast, direct electron detector

Abstract:

Electron ptychography has recently attracted considerable interest for high resolution phase-sensitive imaging. However, to date studies have been mainly limited to radiation resistant samples as the electron dose required to record a ptychographic dataset is too high for use with beam-sensitive materials. Here we report defocused electron ptychography using a fast, direct-counting detector to reconstruct the transmission function, which is in turn related to the electrostatic potential of a ...

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Publication status:
Published
Peer review status:
Peer reviewed
Version:
Publisher's Version

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Publisher copy:
10.1038/s41598-019-40413-z

Authors


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Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
ORCID:
0000-0002-6353-6000
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
ORCID:
0000-0002-7864-8427
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Publisher:
Springer Nature Publisher's website
Journal:
Scientific Reports Journal website
Volume:
9
Pages:
Article: 3919
Publication date:
2019-03-08
Acceptance date:
2019-02-14
DOI:
EISSN:
2045-2322
Pubs id:
pubs:981535
URN:
uri:1a4ea21a-ab5c-4389-aafe-1fd7594e38be
UUID:
uuid:1a4ea21a-ab5c-4389-aafe-1fd7594e38be
Local pid:
pubs:981535

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