Journal article

On the advantages of the use of the three-element detector system for measuring EDXRD patterns to follow the crystallisation of open-framework structures

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APA Style

Muncaster, G., Davies, A., Sankar, G., Catlow, C., Thomas, J., Colston, S., Barnes, P., Walton, R., & O'Hare, D. (2000). On the advantages of the use of the three-element detector system for measuring EDXRD patterns to follow the crystallisation of open-framework structures. PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2(15), 3523–3527.

MLA Style

Muncaster, G, et al. “On the Advantages of the Use of the Three-Element Detector System for Measuring EDXRD Patterns to Follow the Crystallisation of Open-Framework Structures.” PHYSICAL CHEMISTRY CHEMICAL PHYSICS, vol. 2, no. 15, 2000, pp. 3523–27.

Chicago Style

Muncaster, G, A Davies, G Sankar, et al. 2000. “On the Advantages of the Use of the Three-Element Detector System for Measuring EDXRD Patterns to Follow the Crystallisation of Open-Framework Structures.” PHYSICAL CHEMISTRY CHEMICAL PHYSICS 2 (15): 3523–27.
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Publisher copy:: 10.1039/b004171h

Authors

+ Muncaster, G More by this author

Role:: Author

+ Davies, A More by this author

Role:: Author

+ Sankar, G More by this author

Role:: Author

+ Catlow, C More by this author

Role:: Author

+ Thomas, J More by this author

Role:: Author

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Journal:: PHYSICAL CHEMISTRY CHEMICAL PHYSICS More from this journal
Volume:: 2
Issue:: 15
Pages:: 3523-3527
Publication date:: 2000-01-01
DOI:: 10.1039/b004171h
EISSN:: 1463-9084
ISSN:: 1463-9076

Pubs id:: pubs:51098
UUID:: uuid:19c6a41e-0e1b-4c2a-b1a3-e74036611eb2
Local pid:: pubs:51098
Source identifiers:: 51098
Deposit date:: 2012-12-19
ARK identifier:: ark:/29072/ora_19c6a41e0e1b4c2ab1a3e74036611eb2

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Copyright date:: 2000

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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