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Journal article

On the advantages of the use of the three-element detector system for measuring EDXRD patterns to follow the crystallisation of open-framework structures

Publication status:
Published

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Publisher copy:
10.1039/b004171h

Authors


Muncaster, G More by this author
Davies, AT More by this author
Catlow, CRA More by this author
Thomas, JM More by this author
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Journal:
PHYSICAL CHEMISTRY CHEMICAL PHYSICS
Volume:
2
Issue:
15
Pages:
3523-3527
Publication date:
2000
DOI:
EISSN:
1463-9084
ISSN:
1463-9076
URN:
uuid:19c6a41e-0e1b-4c2a-b1a3-e74036611eb2
Source identifiers:
51098
Local pid:
pubs:51098

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