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"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction

Abstract:

Improvements in instrumentation and image processing techniques mean that methods involving reconstruction of focal or beam-tilt series of images are now realizing the promise they have long offered. This indirect approach recovers both the phase and the modulus of the specimen exit plane wave function and can extend the interpretable resolution. However, such reconstructions require the a posteriori determination of the objective lens aberrations, including the actual beam tilt, defocus, and...

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Publication status:
Published

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Publisher copy:
10.1017/S14319276040437

Authors


Kirkland, AI More by this author
Journal:
MICROSCOPY AND MICROANALYSIS
Volume:
10
Issue:
4
Pages:
401-413
Publication date:
2004-08-05
DOI:
ISSN:
1431-9276
URN:
uuid:19a7e2f0-f0c4-4077-a8b6-4f1cb6497edb
Source identifiers:
3939
Local pid:
pubs:3939

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