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Characterization of surface damage via contact probes

Abstract:
The mechanical performance of brittle structural materials, such as engineering ceramics, decreases drastically in the presence of cracks which are inevitably introduced during material preparation via machining and polishing. For functional brittle materials (glasses and semiconductors) their optical and electronic properties may also be affected by the presence of such cracks; furthermore, 'chemical damage' in the form of surface contamination may arise after polishing. We present here two contrasting methods, both utilizing the mechanical probing of a surface, to evaluate such damage.
Publication status:
Published

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Publisher copy:
10.1088/0957-4484/7/3/019

Authors

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author


Journal:
NANOTECHNOLOGY More from this journal
Volume:
7
Issue:
3
Pages:
288-294
Publication date:
1996-09-01
DOI:
EISSN:
1361-6528
ISSN:
0957-4484


Language:
English
Pubs id:
pubs:1158
UUID:
uuid:192c56ee-56e6-4650-9dca-d81f7c1159a9
Local pid:
pubs:1158
Source identifiers:
1158
Deposit date:
2012-12-19
ARK identifier:

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