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Complete spatial characterization of an optical wavefront using a variable-separation pinhole pair.

Abstract:
We present a technique for measuring the transverse spatial properties of an optical wavefront. Intensity and phase profiles are recovered by analysis of a series of interference patterns produced by the combination of a scanning X-shaped slit and a static horizontal slit; the spatial coherence may be found from the same data. We demonstrate the technique by characterizing high harmonic radiation generated in a gas cell, however the method could be extended to a wide variety of light sources.
Publication status:
Published

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Publisher copy:
10.1364/ol.38.001173

Authors


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Institution:
University of Oxford
Department:
Oxford, MPLS, Physics
Role:
Author
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Physics
Role:
Author
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Physics, Atomic and Laser Physics
Role:
Author
Journal:
Optics letters
Volume:
38
Issue:
7
Pages:
1173-1175
Publication date:
2013-04-05
DOI:
EISSN:
1539-4794
ISSN:
0146-9592
URN:
uuid:18da0866-c464-4987-9f9c-d609031456b3
Source identifiers:
394974
Local pid:
pubs:394974
Language:
English

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