Journal article
Complete spatial characterization of an optical wavefront using a variable-separation pinhole pair.
- Abstract:
- We present a technique for measuring the transverse spatial properties of an optical wavefront. Intensity and phase profiles are recovered by analysis of a series of interference patterns produced by the combination of a scanning X-shaped slit and a static horizontal slit; the spatial coherence may be found from the same data. We demonstrate the technique by characterizing high harmonic radiation generated in a gas cell, however the method could be extended to a wide variety of light sources.
- Publication status:
- Published
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- Publisher copy:
- 10.1364/ol.38.001173
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Authors
Bibliographic Details
- Journal:
- Optics letters
- Volume:
- 38
- Issue:
- 7
- Pages:
- 1173-1175
- Publication date:
- 2013-04-01
- DOI:
- EISSN:
-
1539-4794
- ISSN:
-
0146-9592
- Source identifiers:
-
394974
Item Description
- Language:
- English
- Pubs id:
-
pubs:394974
- UUID:
-
uuid:18da0866-c464-4987-9f9c-d609031456b3
- Local pid:
- pubs:394974
- Deposit date:
- 2013-11-17
Terms of use
- Copyright date:
- 2013
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