Journal article

Femtosecond melting and ablation of semiconductors studied with time of flight mass spectroscopy

Publication status:: Published

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APA Style

Cavalleri, A., Sokolowski-Tinten, K., Bialkowski, J., Schreiner, M., & von der Linde, D. (1999). Femtosecond melting and ablation of semiconductors studied with time of flight mass spectroscopy. JOURNAL OF APPLIED PHYSICS, 85(6), 3301–3309.

MLA Style

Cavalleri, A, et al. “Femtosecond Melting and Ablation of Semiconductors Studied with Time of Flight Mass Spectroscopy.” JOURNAL OF APPLIED PHYSICS, vol. 85, no. 6, 1999, pp. 3301–09.

Chicago Style

Cavalleri, A, K Sokolowski-Tinten, J Bialkowski, M Schreiner, and D von der Linde. 1999. “Femtosecond Melting and Ablation of Semiconductors Studied with Time of Flight Mass Spectroscopy.” JOURNAL OF APPLIED PHYSICS 85 (6): 3301–9.
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Publisher copy:: 10.1063/1.369675

Authors

+ Cavalleri, A More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Physics
Sub department:: Atomic & Laser Physics
Role:: Author

+ Sokolowski-Tinten, K More by this author

Role:: Author

+ Bialkowski, J More by this author

Role:: Author

+ Schreiner, M More by this author

Role:: Author

+ von der Linde, D More by this author

Role:: Author

Journal:: JOURNAL OF APPLIED PHYSICS More from this journal
Volume:: 85
Issue:: 6
Pages:: 3301-3309
Publication date:: 1999-03-15
DOI:: 10.1063/1.369675
ISSN:: 0021-8979

Pubs id:: pubs:17855
UUID:: uuid:17dd479a-4b48-4bd6-b964-5f868c90c681
Local pid:: pubs:17855
Source identifiers:: 17855
Deposit date:: 2012-12-19
ARK identifier:: ark:/29072/ora_17dd479a4b484bd6b9645f868c90c681

Terms of use

Copyright date:: 1999

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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