Journal article

AFM studies of polypyrrole film surface morphology - II. Roughness characterization by the fractal dimension analysis

Abstract:: The fractal dimension of electrogenerated polypyrrole films with chloride, sulfate, perchlorate and dodecylsulfate (DDS) anions as dopants is investigated by using atomic force microscopy under ex situ conditions. The results for films both as-prepared and after potentiodynamic cycling in various supporting electrolytes is presented and discussed. © 1998 Elsevier Science S.A.

Publication status:: Published

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APA Style

Silk, T., Hong, Q., Tamm, J., & Compton, R. (1998). AFM studies of polypyrrole film surface morphology - II. Roughness characterization by the fractal dimension analysis. SYNTHETIC METALS, 93(1), 65–71.

MLA Style

Silk, T, et al. “AFM Studies of Polypyrrole Film Surface Morphology - II. Roughness Characterization by the Fractal Dimension Analysis.” SYNTHETIC METALS, vol. 93, no. 1, 1998, pp. 65–71.

Chicago Style

Silk, T, Q Hong, J Tamm, and R Compton. 1998. “AFM Studies of Polypyrrole Film Surface Morphology - II. Roughness Characterization by the Fractal Dimension Analysis.” SYNTHETIC METALS 93 (1): 65–71.
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Publisher copy:: 10.1016/S0379-6779(98)80132-X

Authors

+ Silk, T More by this author

Role:: Author

+ Hong, Q More by this author

Role:: Author

+ Tamm, J More by this author

Role:: Author

+ Compton, R More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Chemistry
Sub department:: Physical & Theoretical Chem
Role:: Author

Journal:: SYNTHETIC METALS More from this journal
Volume:: 93
Issue:: 1
Pages:: 65-71
Publication date:: 1998-02-28
DOI:: 10.1016/S0379-6779(98)80132-X
ISSN:: 0379-6779

Language:: English
Keywords:: atomic force microscopy

surface morphology

polypyrrole

fractal dimensions
UUID:: uuid:1757e726-8efc-49c7-83c9-1abffe2c4157
Local pid:: pubs:36395
Source identifiers:: 36395
Deposit date:: 2012-12-19
ARK identifier:: ark:/29072/ora_1757e7268efc49c783c91abffe2c4157

Terms of use

Copyright date:: 1998

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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