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Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam milling

Abstract:

The preparation of transmission electron microscope (TEM) thin foil specimens from metal alloys containing cracks is usually thwarted by the difficulty in preventing preferential erosion of material along the flanks and at the tips of cracks. Recent developments in focused ion beam (FIB) micromachining methods have the potential to overcome this inherent problem. In this article we describe the development of new procedures, one using FIB alone and the other using a combination of FIB with mo...

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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Role:
Author
Journal:
Journal of Microscopy
Volume:
207
Issue:
2
Pages:
129-136
Publication date:
2002-01-01
DOI:
ISSN:
0022-2720
URN:
uuid:17011c62-5ec3-4548-b59b-b64709ec6394
Source identifiers:
178074
Local pid:
pubs:178074

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