Conference item
Atomic resolution Z-contrast imaging of ultradispersed catalysts
- Abstract:
- Using Z-contrast imaging in a 300 kV scanning transmission electron microscope, direct images of single metal atoms on a support material in industrial catalyst systems are formed. The simultaneously collected conventional bright-field images reveal orientational information about the support, which allows possible configurations of Pt atoms on a gamma-Al2O3 support surface to be deduced. Image intensities also allow the three-dimensional configuration of a raft of Rh atoms on a gamma-Al2O3 support to be determined.
- Publication status:
- Published
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- Journal:
- ELECTRON MICROSCOPY AND ANALYSIS 1997 More from this journal
- Issue:
- 153
- Pages:
- 399-402
- Publication date:
- 1997-01-01
- Event title:
- 1997 Biennial Meeting of the Electron-Microscopy-and-Analysis-Group of the Institute-of-Physics (EMAG 97)
- ISSN:
-
0951-3248
- ISBN:
- 0750304413
- Keywords:
- Pubs id:
-
pubs:22372
- UUID:
-
uuid:16b9cc84-4d41-4cee-8990-660fc2c6a2b8
- Local pid:
-
pubs:22372
- Source identifiers:
-
22372
- Deposit date:
-
2012-12-19
- ARK identifier:
Terms of use
- Copyright date:
- 1997
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