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Atomic resolution Z-contrast imaging of ultradispersed catalysts

Abstract:
Using Z-contrast imaging in a 300 kV scanning transmission electron microscope, direct images of single metal atoms on a support material in industrial catalyst systems are formed. The simultaneously collected conventional bright-field images reveal orientational information about the support, which allows possible configurations of Pt atoms on a gamma-Al2O3 support surface to be deduced. Image intensities also allow the three-dimensional configuration of a raft of Rh atoms on a gamma-Al2O3 support to be determined.
Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author


Journal:
ELECTRON MICROSCOPY AND ANALYSIS 1997 More from this journal
Issue:
153
Pages:
399-402
Publication date:
1997-01-01
Event title:
1997 Biennial Meeting of the Electron-Microscopy-and-Analysis-Group of the Institute-of-Physics (EMAG 97)
ISSN:
0951-3248
ISBN:
0750304413


Keywords:
Pubs id:
pubs:22372
UUID:
uuid:16b9cc84-4d41-4cee-8990-660fc2c6a2b8
Local pid:
pubs:22372
Source identifiers:
22372
Deposit date:
2012-12-19
ARK identifier:

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